Laboratory for Optical Measurement Systems|
Head of the Lab. Dr. Anatoly Potashnikov
Main activity fields
Investigations in the following fields:
development of optical electronic systems for noncontact measurements of profiles and determination of quality of the surfaces of three-dimensional industrial articles
formation of images and diffraction patterns of 3D objects
laser optical metrology based on various measurement methods (shadow, triangulation, interference, structural illumination)
development and production of problem-oriented measuring systems
The Laboratory for Optical Measurement Systems was established in 2002 on the basis of Technical Vision Laboratory.
The laboratory is mainly engaged in the development of optical electronic systems for noncontact measurements of profiles and determination of quality of the surfaces of three-dimensional industrial articles.
The principle of operation of these systems is based on the low-coherent interferometry methods. The latest advances in optical and electronic components, technical design, hardware, and software made it possible to develop unique measuring systems in a short time.
An example is a measuring system called “Radar”. It is designed for noncontact measurement of defects at the surfaces of fuel elements of atomic power stations. This system was developed at the Laboratory for Technical Vision.
The system is used to measure a surface profile of 2.3 mm x 2.3 mm with a depth of up to 10 mm. The measurement error is no more than 2 µm. The measurement time of a 50 µm deep defect is less than 15 seconds. The results of measurements are represented in the form of a three-dimensional model and recorded into a database for a more sophisticated treatment.
This system was listed among the main achievements of Siberian Branch of Russian Academy of Sciences in 2000. Nowadays it is put into operation at a plant of the Ministry of Atomic Energy of Russian Federation.
At the present time, the Laboratory for Optical Measurement Systems is engaged in the development of systems "Profil" with even higher technical and exploitation characteristics.