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Siberian Branch RAS

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PUBLICATIONS 2002

[ 1991 - 96 ][ 1997 ][ 1998 ] [ 1999 ][ 2000 ][ 2001 ] [ 2002 ][ 2003 ][ 2004 ][ 2005 ]

Препринт

Вознюк И.П. Асимптотически точный алгоритм для решения задачи размещения с ограниченными объемами производства и поставки // Препринт Института математики СО РАН. - 2002. - №  92. -   14 с.

 Доклады в сборниках  международных конференций

1.       Automatic device for reading and identification of symbolic information / V.S. Bazin, L.V. Finogenov, I.V. Plekhanova, D.N. Poteev, A.G. Verkhogliad, S.A. Gulyaevsky, N.G. Zagoruiko, Y.S. Shulman, M.Y. Zaitsev // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 618-625. - (Proceedings of SPIE; Vol. 4900).

2.       Berezhnaja P.E. Nonlinear-optical monitoring system of materials local crystalline characteristics / P.E. Berezhnaja, M.F. Stupak  // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 98 -103. - (Proceedings of SPIE; Vol. 4900).

3.       Chugui Yu.V. Peculiarities of Interference method for measuring the diameters of circular reflecting cylinders / Yu.V. Chugui, Yu.A. Lemeshko // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 525 -533. - (Proceedings of SPIE; Vol. 4900).

4.       Interference systems for 3D surface profiling and analysis using partially coherent light / Ye.V. Sysoev, I.A. Fomicheva, I.V. Golubev, Yu.D. Makashev, P.A. Orekhov, V.A. Shakhmatov, L.M. Stepnov // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 213 -219. - (Proceedings of SPIE; Vol. 4900).

5.       Kiryanov V.P.  Development and research of the scanning method for testing of diffraction optical elements  / V.P. Kiryanov, V.G. Nikitin, A.G. Verkhogliad // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part Two. - P. 977-981. - (Proceedings of SPIE; Vol. 4900).

6.       Laser measuring machine for 3D noncontact inspection of geometric parameters of grid spacers for nuclear reactors VVER-1000 / O.I. Bityutsky, Yu.V. Chugui, A.A. Gushchina, K.I. Kuchinsky, V.I. Ladygin, S.V. Plotnikov, V.V. Vertoprakhov, V.P. Yunoshev, I.G. Chapaev, Yu.K. Karlov, V.V. Rozhkov, M.G. Zarubin, Yu.V. Pimenov, V.M. Chernyshov // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 202 -212. - (Proceedings of SPIE; Vol. 4900).

7.       Laser writing system CLWS-300/C-M for the microstructures synthesis on the axisymmetric 3-D surfaces / V.M. Gurenko, L.B. Kastorsky, V.P. Kiryanov, A.V. Kiryanov, S.A. Kokarev, V.M. Vedernikov, A.G. Verkhogliad // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 320 -325. - (Proceedings of SPIE; Vol. 4900).

8.       Laser-aided separation of diamonds  / S.E. Avdeev, S.V. Bely, V.A. Chuprov, A.F. Makhrachev, E.M. Schlufman, A.T. Vedin, Yu.V. Chugui, A.K. Potashnikov, V.V. Vorobyev, O.A. Gudaev, I.F. Kanaev, V.K. Malinovsky, A.M. Pugachev, N.V. Surovtsev, V.A. Treshchikhin // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part Two. - P. 946-951. - (Proceedings of SPIE; Vol. 4900).

9.       Nondestructive inspection of the fuel element weld seam by a panoramic tomography method   / Yu.K. Karlov, V.P. Kosych, Yu.V. Obidin, A.K. Potashnikov // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part Two. - P. 677-684. - (Proceedings of SPIE; Vol. 4900).

10.   Optoelectronic devices “Control” for noncontact dimensional inspection of fuel elements of nuclear reactors VVER-1000 and VVER-440 / V.A. Beloglazova, О.I. Bitytsky, Yu.V. Chugui, А.А. Gushchina, B.Е. Krivenkov, V.I. Ladygin, V.I. Nesin, А.I. Pastushenko, S.P. Yunoshev, V.P. Yunoshev, I.G. Chapaev, Yu.K. Karlov, V.V. Rozhkov, V.M. Chernyshov, Yu.V. Pimenov // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 659 -668. - (Proceedings of SPIE; Vol. 4900).

11.   Optoelectronic system for size inspection of round through holes in sieves  / A.V. Budantsev, E.L. Emelyanov, Yu.V. Obidin, V.I. Paterikin, K.V. Petukhov, A.K. Potashnikov, D.N. Bondar, N.V. Budanov // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part Two. - P. 669-676. - (Proceedings of SPIE; Vol. 4900)

12.   Optoelectronic systems for a noncontact dimensional inspection of the cylindrical items in atomic industry  / A.N. Baybakov, Yu.V. Chugui, K.P. Kascheev, K.I. Koutchinski, V.I. Ladygin, A.I. Pastushenko, R.D. Pchelkin, S.V. Plotnikov,  N.T. Tukubaev, S.P. Yunoshev, Yu.K. Karlov, V.G. Marchenko, A.A. Palekhin, V.V. Rozhkov, M.V. Shindryaev, Yu.A. Zhukov // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 565 -571. - (Proceedings of SPIE; Vol. 4900).

13.   Plotnikov S.V. Study and development of triangulation meters at the TDI SIE and their industrial use   / S.V. Plotnikov, V.M. Podchernin, I.V. Bykovskaya // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 641-648. - (Proceedings of SPIE; Vol. 4900).

14.   Sysoev Ye.V. Noncontact measurements of  local distances in  partially coherent light / Ye.V. Sysoev, I.V. Golubev, R.V. Kulikov // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 537 -540. - (Proceedings of SPIE; Vol. 4900).

15.   Use of laser beam technologies for modernization of the Siberian Solar Radio Telescope / A.T. Altyntsev, V.G. Zandanov, Yu.V. Chugui, V.P. Kiryanov, A.K. Potashnikov // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 119 -124. - (Proceedings of SPIE; Vol. 4900).

16.   Use of the method of local anisotropic features for symbolic image recognition  / I.V. Borisova, V.N. Gorenok, P.G. Popov, A.E. Kazikin, Yu.S. Schulman, L.V. Finogenov, I.V. Plekhanova, A.G. Verkhogliad // Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: Proc. In Two Parts, 9-13 September 2002, Novosibirsk, Russia / Ed. by Y.V. Chugui, S.N. Bagaev, A. Weckenmann, P. H. Osanna; SPIE, TDI SIE SB RAS; ILP SB RAS; IMEKO. - Bellingham: Publ. by SPIE, 2002. - Part One. - P. 626-632. - (Proceedings of SPIE; Vol. 4900).

Тезисы доклада в сборнике  международной конференции

    Вознюк И.П. Асимптотически точные алгоритмы для решения задач размещения с ограниченными объемами производства и поставок / И.П. Вознюк, Э.Х. Гимади, М.Ю. Филатов  // Тезисы докладов на Международной конференция "Дискретный анализ и исследование операций", Новосибирск, июнь 2002. -  С. 48.

Охранные документы

     Патент РФ № 2183030, МКИ7 G 02 B 27/00, 27/14, G 06 K 7/10. Считыватель кода с поверхности тел вращения / Л.Б. Касторский, В.П. Кирьянов, Ю.В. Обидин, Л.В. Финогенов. – Опубл. 27.05.2002, Бюл. № 15; Приоритет 15.05.2000. – 5 с.: ил.

 
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